From specification to measurement: the bottleneck in analog industrial testing
نویسندگان
چکیده
The translation of the specification of an analog device into the necessary set of measurements to be carried out by an industrial test facility, is discussed. Algorithms are developed to compute the number of testvectors needed to guarantee a certain parameter and to compare several possible testmethods, based on accuracy. An important input for these algorithms: the measurement error is also discussed.
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